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The mechanism of lifetime extension due to CuPc injection layer in organic light emitting diodes

Identifieur interne : 00AA70 ( Main/Repository ); précédent : 00AA69; suivant : 00AA71

The mechanism of lifetime extension due to CuPc injection layer in organic light emitting diodes

Auteurs : RBID : Pascal:05-0119101

Descripteurs français

Pascal (Inist)
- Durabilité, Diode électroluminescente organique, Anode, Mobilité porteur charge, Accumulation charge, Champ électrique, Densité courant, Rugosité, Injection porteur charge, Trou, Canalisation particule, Endommagement, Fiabilité, Dispositif optoélectronique, Phtalocyanine métallique, Cuivre complexe, Matériau revêtu, Indium oxyde, Etain oxyde, Addition étain, Revêtement, ITO.

English descriptors

KwdEn :
- Anode, Channeling, Charge accumulation, Charge carrier injection, Charge carrier mobility, Coated material, Coatings, Copper complex, Current density, Damaging, Durability, Electric field, Hole, Indium oxide, Metallophthalocyanine, Optoelectronic device, Organic light emitting diodes, Reliability, Roughness, Tin addition, Tin oxide.

Abstract

The remarkable effect on lifetime improvement of copper phthalocianine (CuPc) coated indium tin oxide (ITO) anode of organic light emitting diodes (OLED's) is experimentally well approved. Also known are the electrode morphology, with and without CuPc coating, the energy levels of the used materials, important for charge injection and conduction, the carrier mobility etc. Based on this knowledge we suggest the model that explains the mechanism behind the lifetime improvement. We argue that the charge accumulation at the interface between the CuPc and the hole transport layer is responsible for screening out of the electric field variations leading to current density homogenization across the OLED surface. The variation of the injection field, introduced by electrode roughness, is estimated for typical indium tin oxide morphology used in OLED production. Without the CuPc hole injection layer a substantial current channeling occurs in OLED's, leading to accelerated device degradation.

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Pascal:05-0119101

Le document en format XML

<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">The mechanism of lifetime extension due to CuPc injection layer in organic light emitting diodes</title>
<author><name sortKey="Tutis, Eduard" uniqKey="Tutis E">Eduard Tutis</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Institute of Physics, P.O. Box 304</s1>
<s2>1000 Zagreb</s2>
<s3>HRV</s3>
<sZ>1 aut.</sZ>
</inist:fA14>
<country>Croatie</country>
<wicri:noRegion>1000 Zagreb</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Berner, Detlef" uniqKey="Berner D">Detlef Berner</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>CFG S.A. Microelectronic</s1>
<s2>1110 Morges</s2>
<s3>CHE</s3>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Suisse</country>
<wicri:noRegion>CFG S.A. Microelectronic</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Zuppiroli, Libero" uniqKey="Zuppiroli L">Libero Zuppiroli</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s1>LOMM/IMX, Ecole Polytechnique Fédérale</s1>
<s2>1015 Lausanne</s2>
<s3>CHE</s3>
<sZ>3 aut.</sZ>
</inist:fA14>
<country>Suisse</country>
<placeName><settlement type="city">Lausanne</settlement>
<region nuts="3" type="region">Canton de Vaud</region>
</placeName>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="inist">05-0119101</idno>
<date when="2004">2004</date>
<idno type="stanalyst">PASCAL 05-0119101 INIST</idno>
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<seriesStmt><idno type="ISSN">1017-2653</idno>
<title level="j" type="main">SPIE proceedings series</title>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Anode</term>
<term>Channeling</term>
<term>Charge accumulation</term>
<term>Charge carrier injection</term>
<term>Charge carrier mobility</term>
<term>Coated material</term>
<term>Coatings</term>
<term>Copper complex</term>
<term>Current density</term>
<term>Damaging</term>
<term>Durability</term>
<term>Electric field</term>
<term>Hole</term>
<term>Indium oxide</term>
<term>Metallophthalocyanine</term>
<term>Optoelectronic device</term>
<term>Organic light emitting diodes</term>
<term>Reliability</term>
<term>Roughness</term>
<term>Tin addition</term>
<term>Tin oxide</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Durabilité</term>
<term>Diode électroluminescente organique</term>
<term>Anode</term>
<term>Mobilité porteur charge</term>
<term>Accumulation charge</term>
<term>Champ électrique</term>
<term>Densité courant</term>
<term>Rugosité</term>
<term>Injection porteur charge</term>
<term>Trou</term>
<term>Canalisation particule</term>
<term>Endommagement</term>
<term>Fiabilité</term>
<term>Dispositif optoélectronique</term>
<term>Phtalocyanine métallique</term>
<term>Cuivre complexe</term>
<term>Matériau revêtu</term>
<term>Indium oxyde</term>
<term>Etain oxyde</term>
<term>Addition étain</term>
<term>Revêtement</term>
<term>ITO</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">The remarkable effect on lifetime improvement of copper phthalocianine (CuPc) coated indium tin oxide (ITO) anode of organic light emitting diodes (OLED's) is experimentally well approved. Also known are the electrode morphology, with and without CuPc coating, the energy levels of the used materials, important for charge injection and conduction, the carrier mobility etc. Based on this knowledge we suggest the model that explains the mechanism behind the lifetime improvement. We argue that the charge accumulation at the interface between the CuPc and the hole transport layer is responsible for screening out of the electric field variations leading to current density homogenization across the OLED surface. The variation of the injection field, introduced by electrode roughness, is estimated for typical indium tin oxide morphology used in OLED production. Without the CuPc hole injection layer a substantial current channeling occurs in OLED's, leading to accelerated device degradation.</div>
</front>
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<fA11 i1="02" i2="1"><s1>BERNER (Detlef)</s1>
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<fA11 i1="03" i2="1"><s1>ZUPPIROLI (Libero)</s1>
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<fA12 i1="01" i2="1"><s1>HEREMANS (Paul L.)</s1>
<s9>ed.</s9>
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<s9>ed.</s9>
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<fA14 i1="01"><s1>Institute of Physics, P.O. Box 304</s1>
<s2>1000 Zagreb</s2>
<s3>HRV</s3>
<sZ>1 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>CFG S.A. Microelectronic</s1>
<s2>1110 Morges</s2>
<s3>CHE</s3>
<sZ>2 aut.</sZ>
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<fA14 i1="03"><s1>LOMM/IMX, Ecole Polytechnique Fédérale</s1>
<s2>1015 Lausanne</s2>
<s3>CHE</s3>
<sZ>3 aut.</sZ>
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<fA18 i1="01" i2="1"><s1>International Society for Optical Engineering</s1>
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<s9>patr.</s9>
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<fA20><s1>330-336</s1>
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<fC01 i1="01" l="ENG"><s0>The remarkable effect on lifetime improvement of copper phthalocianine (CuPc) coated indium tin oxide (ITO) anode of organic light emitting diodes (OLED's) is experimentally well approved. Also known are the electrode morphology, with and without CuPc coating, the energy levels of the used materials, important for charge injection and conduction, the carrier mobility etc. Based on this knowledge we suggest the model that explains the mechanism behind the lifetime improvement. We argue that the charge accumulation at the interface between the CuPc and the hole transport layer is responsible for screening out of the electric field variations leading to current density homogenization across the OLED surface. The variation of the injection field, introduced by electrode roughness, is estimated for typical indium tin oxide morphology used in OLED production. Without the CuPc hole injection layer a substantial current channeling occurs in OLED's, leading to accelerated device degradation.</s0>
</fC01>
<fC02 i1="01" i2="X"><s0>001D03F15</s0>
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<fC03 i1="04" i2="X" l="FRE"><s0>Mobilité porteur charge</s0>
<s5>04</s5>
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<fC03 i1="04" i2="X" l="ENG"><s0>Charge carrier mobility</s0>
<s5>04</s5>
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<fC03 i1="04" i2="X" l="SPA"><s0>Movilidad portador carga</s0>
<s5>04</s5>
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<fC03 i1="05" i2="X" l="FRE"><s0>Accumulation charge</s0>
<s5>05</s5>
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<fC03 i1="05" i2="X" l="ENG"><s0>Charge accumulation</s0>
<s5>05</s5>
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<fC03 i1="05" i2="X" l="SPA"><s0>Acumulación carga</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="X" l="FRE"><s0>Champ électrique</s0>
<s5>06</s5>
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<s5>07</s5>
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<s5>07</s5>
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<s5>08</s5>
</fC03>
<fC03 i1="08" i2="X" l="ENG"><s0>Roughness</s0>
<s5>08</s5>
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<fC03 i1="08" i2="X" l="SPA"><s0>Rugosidad</s0>
<s5>08</s5>
</fC03>
<fC03 i1="09" i2="X" l="FRE"><s0>Injection porteur charge</s0>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="ENG"><s0>Charge carrier injection</s0>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="SPA"><s0>Inyección portador carga</s0>
<s5>09</s5>
</fC03>
<fC03 i1="10" i2="X" l="FRE"><s0>Trou</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="ENG"><s0>Hole</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="SPA"><s0>Hoyo</s0>
<s5>10</s5>
</fC03>
<fC03 i1="11" i2="X" l="FRE"><s0>Canalisation particule</s0>
<s5>11</s5>
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<fC03 i1="11" i2="X" l="ENG"><s0>Channeling</s0>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="X" l="SPA"><s0>Canalización partícula</s0>
<s5>11</s5>
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<s5>12</s5>
</fC03>
<fC03 i1="12" i2="X" l="ENG"><s0>Damaging</s0>
<s5>12</s5>
</fC03>
<fC03 i1="12" i2="X" l="SPA"><s0>Deterioración</s0>
<s5>12</s5>
</fC03>
<fC03 i1="13" i2="X" l="FRE"><s0>Fiabilité</s0>
<s5>13</s5>
</fC03>
<fC03 i1="13" i2="X" l="ENG"><s0>Reliability</s0>
<s5>13</s5>
</fC03>
<fC03 i1="13" i2="X" l="SPA"><s0>Fiabilidad</s0>
<s5>13</s5>
</fC03>
<fC03 i1="14" i2="X" l="FRE"><s0>Dispositif optoélectronique</s0>
<s5>14</s5>
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<s5>14</s5>
</fC03>
<fC03 i1="14" i2="X" l="SPA"><s0>Dispositivo optoelectrónico</s0>
<s5>14</s5>
</fC03>
<fC03 i1="15" i2="X" l="FRE"><s0>Phtalocyanine métallique</s0>
<s5>22</s5>
</fC03>
<fC03 i1="15" i2="X" l="ENG"><s0>Metallophthalocyanine</s0>
<s5>22</s5>
</fC03>
<fC03 i1="15" i2="X" l="SPA"><s0>Ftalocianina metálica</s0>
<s5>22</s5>
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<fC03 i1="16" i2="X" l="FRE"><s0>Cuivre complexe</s0>
<s5>23</s5>
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<fC03 i1="16" i2="X" l="ENG"><s0>Copper complex</s0>
<s5>23</s5>
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<fC03 i1="16" i2="X" l="SPA"><s0>Cobre complejo</s0>
<s5>23</s5>
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<s5>24</s5>
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<s5>24</s5>
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<s5>24</s5>
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<s5>25</s5>
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<s5>25</s5>
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<s5>25</s5>
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<s5>26</s5>
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<s5>26</s5>
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<s5>26</s5>
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<fC03 i1="20" i2="X" l="FRE"><s0>Addition étain</s0>
<s5>27</s5>
</fC03>
<fC03 i1="20" i2="X" l="ENG"><s0>Tin addition</s0>
<s5>27</s5>
</fC03>
<fC03 i1="20" i2="X" l="SPA"><s0>Adición estaño</s0>
<s5>27</s5>
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<s5>28</s5>
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<s5>28</s5>
</fC03>
<fC03 i1="21" i2="X" l="SPA"><s0>Revestimiento</s0>
<s5>28</s5>
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<fC03 i1="22" i2="X" l="FRE"><s0>ITO</s0>
<s4>INC</s4>
<s5>83</s5>
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<fN21><s1>080</s1>
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<fN44 i1="01"><s1>OTO</s1>
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<pR><fA30 i1="01" i2="1" l="ENG"><s1>Organic optoelectronics and photonics. Conference</s1>
<s3>Strasbourg FRA</s3>
<s4>2004-04-28</s4>
</fA30>
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The mechanism of lifetime extension due to CuPc injection layer in organic light emitting diodes

The mechanism of lifetime extension due to CuPc injection layer in organic light emitting diodes

Descripteurs français

English descriptors

Abstract

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Links to Exploration step

Le document en format XML

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